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Low Frequency Noise Variability Analysis Depending on Epi-Source/Drain in GAA (Gate-All-Around) FET
Low Frequency Noise Variability Analysis Depending on Epi-Source/Drain in GAA (Gate-All-Around) FET
- 제목
- Low Frequency Noise Variability Analysis Depending on Epi-Source/Drain in GAA (Gate-All-Around) FET
- 제목 (타언어)
- Low Frequency Noise Variability Analysis Depending on Epi-Source/Drain in GAA (Gate-All-Around) FET
- 저자
- LEE Jae Woo
- 발행일
- 2019-02-14
- 학회명
- 제 26회 한국반도체학술대회
- 개최국가
- 대한민국
- 학회 개최일
- 2019-02-13 ~ 2019-02-15