ScholarWorks@고려대학교

상세 보기

Remanence analyses of sub-micron MTJ cells with CoFe/NiFe free layers

제목
Remanence analyses of sub-micron MTJ cells with CoFe/NiFe free layers
저자
Kim, Young Keun
학회명
SOMMA/KMS Meeting
개최국가
대한민국
학회 개최일
2003-12-03 ~ 2003-12-06

ScholarWorks@고려대학교

02841 서울특별시 성북구 안암로 145 Tel. 02-3290-2963

COPYRIGHT © 고려대학교 All Rights Reserved.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.

You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.