Fluorination, and Tunneling across Molecular Junctions

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초록

This paper describes the influence of the substitution of fluorine for hydrogen on the rate of charge transport by hole tunneling through junctions of the form (AgO2C)-O-TS(CH2)(n)(CF2)(m)T//Ga2O3/EGaIn, where T is methyl (CH3) or trifluoromethyl (CF3). Alkanoate-based selfassembled monolayers (SAMs) having perfluorinated groups (R-F) show current densities that are lower (by factors of 20-30) than those of the homologous hydrocarbons (R-H), while the attenuation factors of the simplified Simmons equation for methylene (beta = (1.05 +/- 0.02)n(CH2)(-1)) and difluoromethylene (beta = (1.15 +/- 0.02)(nCF2)(-1)) are similar (although the value for (CF2)(n) is statistically significantly larger). A comparative study focusing on the terminal fluorine substituents in SAMs of omega-tolyl- and -phenyl-alkanoates suggests that the C-F//Ga2O3 interface is responsible for the lower tunneling currents for CF3. The decrease in the rate of charge transport in SAMs with R-F groups (relative to homologous RH groups) is plausibly due to an increase in the height of the tunneling barrier at the T//Ga2O3 interface, and/or to weak van der Waals interactions at that interface.

키워드

SELF-ASSEMBLED MONOLAYERS; SIGNIFICANTLY CHANGE RATES; METAL WORK FUNCTION; CHARGE-TRANSPORT; CONTACT; INTERFACE; GOLD; SAMS; WETTABILITY; RESISTANCE
제목
Fluorination, and Tunneling across Molecular Junctions
저자
Liao, Kung-Ching; Bowers, Carleen M.; Yoon, Hyo Jae; Whitesides, George M.
DOI
10.1021/jacs.5b00137
발행일
2015-03-25
유형
Article
저널명
Journal of the American Chemical Society
권
137
호
11
페이지
3852 ~ 3858