PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration

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초록

A current source with a small current error has been proposed to maintain the bandwidth of the system without an increase in power consumption for a margin. It minimizes the current error under process, supply voltage, and temperature (PVT) variations. Because the on-resistance of the nMOS array is self-calibrated digitally by an on-chip digital PVT detector, a current error of only +/- 2% is achieved. The current source has been implemented in an 80-nm CMOS process, occupies 0.018 mm(2) and consumes 94.9 mu W at a supply voltage of 1.0 V.

키워드

All digital gatescurrent sourceon-chipprocess, supply voltage, and temperature (PVT) detectorself-calibrationRESISTANCE
제목
PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration
저자
Kim, Moo-YoungLee, HokyuKim, Chulwoo
DOI
10.1109/TVLSI.2011.2109971
발행일
2012-04
유형
Article
저널명
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
20
4
페이지
737 ~ 741