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PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration
- Kim, Moo-Young;
- Lee, Hokyu;
- Kim, Chulwoo
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13초록
A current source with a small current error has been proposed to maintain the bandwidth of the system without an increase in power consumption for a margin. It minimizes the current error under process, supply voltage, and temperature (PVT) variations. Because the on-resistance of the nMOS array is self-calibrated digitally by an on-chip digital PVT detector, a current error of only +/- 2% is achieved. The current source has been implemented in an 80-nm CMOS process, occupies 0.018 mm(2) and consumes 94.9 mu W at a supply voltage of 1.0 V.
키워드
All digital gates; current source; on-chip; process, supply voltage, and temperature (PVT) detector; self-calibration; RESISTANCE
- 제목
- PVT Variation Tolerant Current Source With On-Chip Digital Self-Calibration
- 저자
- Kim, Moo-Young; Lee, Hokyu; Kim, Chulwoo
- 발행일
- 2012-04
- 유형
- Article
- 권
- 20
- 호
- 4
- 페이지
- 737 ~ 741