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Effects of Channel Doping Profile on Electrical Characteristics of Impact Ionization MOS

  • Sung, Man Young
제목
Effects of Channel Doping Profile on Electrical Characteristics of Impact Ionization MOS
저자
Sung, Man Young
학회명
2005 International Semiconductor Device research Symposium
개최지
Maryland,USA
학회 개최일
2005-12-07 ~ 2005-12-09

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