상세 보기
Adaptive ECC for Tailored Protection of Nanoscale Memory
- Shin, Dongyeob;
- Park, Jongsun;
- Park, Jangwon;
- Paul, Somnath;
- Bhunia, Swarup
Citations
WEB OF SCIENCE
5Citations
SCOPUS
6키워드
Error Correction Code (ECC); Memory Failures; Robust Nanoscale Memory; Run-time Protection; Variable ECC; RELIABILITY; CIRCUITS
- 제목
- Adaptive ECC for Tailored Protection of Nanoscale Memory
- 저자
- Shin, Dongyeob; Park, Jongsun; Park, Jangwon; Paul, Somnath; Bhunia, Swarup
- 발행일
- 2017-11
- 유형
- Article
- 권
- 34
- 호
- 6
- 페이지
- 84 ~ 93
- 언어
- ENG
- 출판사
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- 발행국가
- 미국
- 분량
- 10 페이지
- ISSN
- E 2168-2364
P 2168-2356