Measurement of low-energy events due to Rn-222 daughter contamination on the surface of a NaI(Tl) crystal

  • Kim, K. W.
  • Ha, C.
  • Kim, N. Y.
  • Kim, Y. D.
  • Lee, H. S.
  • ... Park, H. K.
  • 외 1명
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초록

It has been known that decays of daughter elements of Rn-222 on the surface of a detector cause significant background at energies below 10 keV. In particular Pb-210 and Po-210 decays on the crystal surface result in significant background for dark matter search experiments with Nal(Tl) crystals. In this report, measurement of Pb-210 and Po-210 decays on surfaces are obtained by using a Rn-222 contaminated crystal. Alpha decay events of Po-210 on the surface are measured by coincidence requirements of two attached crystals. Due to recoiling of Pb-206, rapid nuclear recoil events are observed. A mean time characterization demonstrates that Pb-206 recoil events can be statistically separated from those of sodium or iodine nuclear recoil events, as well as electron recoil events. (C) 2018 Elsevier B.V. All rights reserved.

키워드

Dark matterWIMPNal(TI)Surface Pb-210BACKGROUNDSDAMA/LIBRASEARCH
제목
Measurement of low-energy events due to Rn-222 daughter contamination on the surface of a NaI(Tl) crystal
저자
Kim, K. W.Ha, C.Kim, N. Y.Kim, Y. D.Lee, H. S.Park, B. J.Park, H. K.
DOI
10.1016/j.astropartphys.2018.05.004
발행일
2018-11
유형
Article
저널명
Astroparticle Physics
102
페이지
51 ~ 55