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Measurement of low-energy events due to Rn-222 daughter contamination on the surface of a NaI(Tl) crystal
- Kim, K. W.;
- Ha, C.;
- Kim, N. Y.;
- Kim, Y. D.;
- Lee, H. S.;
- ... Park, H. K.;
- 외 1명
WEB OF SCIENCE
3SCOPUS
3초록
It has been known that decays of daughter elements of Rn-222 on the surface of a detector cause significant background at energies below 10 keV. In particular Pb-210 and Po-210 decays on the crystal surface result in significant background for dark matter search experiments with Nal(Tl) crystals. In this report, measurement of Pb-210 and Po-210 decays on surfaces are obtained by using a Rn-222 contaminated crystal. Alpha decay events of Po-210 on the surface are measured by coincidence requirements of two attached crystals. Due to recoiling of Pb-206, rapid nuclear recoil events are observed. A mean time characterization demonstrates that Pb-206 recoil events can be statistically separated from those of sodium or iodine nuclear recoil events, as well as electron recoil events. (C) 2018 Elsevier B.V. All rights reserved.
키워드
- 제목
- Measurement of low-energy events due to Rn-222 daughter contamination on the surface of a NaI(Tl) crystal
- 저자
- Kim, K. W.; Ha, C.; Kim, N. Y.; Kim, Y. D.; Lee, H. S.; Park, B. J.; Park, H. K.
- 발행일
- 2018-11
- 유형
- Article
- 권
- 102
- 페이지
- 51 ~ 55