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Bias Voltage Dependence of Magnetic Tunnel Junctions Comprising Double Barriers and Using CoFe/NiFeSiB/CoFe Free Layer
- 제목
- Bias Voltage Dependence of Magnetic Tunnel Junctions Comprising Double Barriers and Using CoFe/NiFeSiB/CoFe Free Layer
- 저자
- Kim, Young Keun
- 학회명
- International Magnetics Conference
- 개최국가
- 미국
- 학회 개최일
- 2006-05-05 ~ 2006-05-09