상세 보기
초록
Neutrons with an average energy of 9.8 +/- 0.8 MeV were irradiated onto silicon carbide Schottky diodes. After bombardment at a fluency of 2.75 x 10(11) neutron/cm(2), the Schottky barrier height, ideality factor, and the leakage Currents remained unchanged. The electrical properties began to deteriorate after bombardment at a fluency of 5.5 x 10(11) neutron/cm(2). In this study, we demonstrate that SiC SBD is robust under neutron irradiations and is well suited for space operations up to bombardments at a fluency of 2.75 x 10(11) neutron/cm(2).
키워드
Neutron Irradiation; Silicon Carbide; Diode; MOBILITY TRANSISTORS
- 제목
- Electrical characterizations of Neutron-irradiated SiC Schottky diodes
- 저자
- Ko, Geunwoo; Kim, Hong-Yeol; Bang, Joona; Kim, Jihyun
- 발행일
- 2009-01
- 유형
- Article
- 권
- 26
- 호
- 1
- 페이지
- 285 ~ 287