Electrical characterizations of Neutron-irradiated SiC Schottky diodes

  • Ko, Geunwoo
  • Kim, Hong-Yeol
  • Bang, Joona
  • Kim, Jihyun
Citations

WEB OF SCIENCE

10
Citations

SCOPUS

12

초록

Neutrons with an average energy of 9.8 +/- 0.8 MeV were irradiated onto silicon carbide Schottky diodes. After bombardment at a fluency of 2.75 x 10(11) neutron/cm(2), the Schottky barrier height, ideality factor, and the leakage Currents remained unchanged. The electrical properties began to deteriorate after bombardment at a fluency of 5.5 x 10(11) neutron/cm(2). In this study, we demonstrate that SiC SBD is robust under neutron irradiations and is well suited for space operations up to bombardments at a fluency of 2.75 x 10(11) neutron/cm(2).

키워드

Neutron IrradiationSilicon CarbideDiodeMOBILITY TRANSISTORS
제목
Electrical characterizations of Neutron-irradiated SiC Schottky diodes
저자
Ko, GeunwooKim, Hong-YeolBang, JoonaKim, Jihyun
DOI
10.1007/s11814-009-0049-2
발행일
2009-01
유형
Article
저널명
Korean Journal of Chemical Engineering
26
1
페이지
285 ~ 287