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Fault Detection of Manufacturing Process Based on Dynamic Time Warping and Exponential Penalty (DTWEP)
Fault Detection of Manufacturing Process Based on Dynamic Time Warping and Exponential Penalty (DTWEP)
- 제목
- Fault Detection of Manufacturing Process Based on Dynamic Time Warping and Exponential Penalty (DTWEP)
- 제목 (타언어)
- Fault Detection of Manufacturing Process Based on Dynamic Time Warping and Exponential Penalty (DTWEP)
- 저자
- Jun-Geol Baek
- 발행일
- 2016-10-10
- 학회명
- The 18th International Conference on Industrial Engineering (IJIE 2016)
- 개최지
- Hotel President, Seoul
- 개최국가
- 대한민국
- 학회 개최일
- 2016-10-10 ~ 2016-10-12