Sequential Locally Optimum Test (SLOT): A Sequential Detection Scheme Based on Locally Optimum Test Statistic

Bae, Jinsoo; Park, Seong Ill; Kim, Yun Hee; Yoon, Seokho; Oh, Jongho; Song, Iickho; Oh, Seong-Jun

doi:10.1587/transfun.E93.A.2045

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Sequential Locally Optimum Test (SLOT): A Sequential Detection Scheme Based on Locally Optimum Test Statistic

Bae, Jinsoo;
Park, Seong Ill;
Kim, Yun Hee;
Yoon, Seokho;
Oh, Jongho;
... Oh, Seong-Jun;
외 1명

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초록

Based on the characteristics of the thresholds of two detection schemes employing locally optimum test statistics a sequential detection design procedure is proposed and analyzed The proposed sequential test called the sequential locally optimum test (SLOT) inherently provides finite stopping time (terminates with probability one within the finite horizon) and thereby avoids undesirable forced termination The performance of the SLOT is compared with that of the fixed sample size test sequential probability ratio test (SPRT) truncated SPRT and 2 SPRT It is observed that the SLOT requires smaller average sample numbers than other schemes at most values of the normalized signal amplitude while maintaining the error performance close to the SPRT

키워드

asymptotic sample number; locally optimum detector; minimum false alarm; sequential test; sequential probability ratio test; KIEFER-WEISS PROBLEM; PROBABILITY RATIO TESTS; EXPECTED SAMPLE-SIZE; SIGNAL-DETECTION; EFFICIENCIES

제목: Sequential Locally Optimum Test (SLOT): A Sequential Detection Scheme Based on Locally Optimum Test Statistic

저자: Bae, Jinsoo; Park, Seong Ill; Kim, Yun Hee; Yoon, Seokho; Oh, Jongho; Song, Iickho; Oh, Seong-Jun

DOI: 10.1587/transfun.E93.A.2045

발행일: 2010-11

유형: Article

저널명: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences

권: E93A

호: 11

페이지: 2045 ~ 2056