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Enhancement of measurement sensitivity of polarization holographic microscopy
Enhancement of measurement sensitivity of polarization holographic microscopy
- 제목
- Enhancement of measurement sensitivity of polarization holographic microscopy
- 제목 (타언어)
- Enhancement of measurement sensitivity of polarization holographic microscopy
- 저자
- Kim, Beop-Min
- 발행일
- 2019-07-15
- 학회명
- The 30th Anniversary of the Optical Society of Korea Optics and Photonics Congress 2019
- 개최국가
- 대한민국
- 학회 개최일
- 2019-07-14 ~ 2019-07-17