상세 보기
Data Analysis Method for Facility Breakdown Prediction in the Semiconductor Manufacturing Process
Data Analysis Method for Facility Breakdown Prediction in the Semiconductor Manufacturing Process
- 제목
- Data Analysis Method for Facility Breakdown Prediction in the Semiconductor Manufacturing Process
- 제목 (타언어)
- Data Analysis Method for Facility Breakdown Prediction in the Semiconductor Manufacturing Process
- 저자
- Jun-Geol Baek
- 발행일
- 2016-07-04
- 학회명
- 28th European Conference on Operational Research (EURO 2016)
- 개최지
- Poznan, Poland
- 개최국가
- 폴란드
- 학회 개최일
- 2016-07-03 ~ 2016-07-06