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Generation of depth-selectivity for reflection phase microscopy by accumulation of interferograms
Generation of depth-selectivity for reflection phase microscopy by accumulation of interferograms
- 제목
- Generation of depth-selectivity for reflection phase microscopy by accumulation of interferograms
- 제목 (타언어)
- Generation of depth-selectivity for reflection phase microscopy by accumulation of interferograms
- 저자
- Kim, Beop-Min
- 발행일
- 2018-01-29
- 학회명
- 2018 Photonics West
- 개최국가
- 미국
- 학회 개최일
- 2018-01-27 ~ 2018-02-01