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Contrastive CNN for Mixed-type Pattern Recognition with Single-type Pattern on Wafer Bin Maps
Contrastive CNN for Mixed-type Pattern Recognition with Single-type Pattern on Wafer Bin Maps
- 제목
- Contrastive CNN for Mixed-type Pattern Recognition with Single-type Pattern on Wafer Bin Maps
- 제목 (타언어)
- Contrastive CNN for Mixed-type Pattern Recognition with Single-type Pattern on Wafer Bin Maps
- 저자
- Jun-Geol Baek
- 발행일
- 2021-07-14
- 학회명
- 31st European Conference on Operational Research (EURO 2021)
- 개최지
- Athens, Greece
- 개최국가
- 그리스
- 학회 개최일
- 2021-07-11 ~ 2021-07-14