Shielding region effects on a trench gate IGBT

  • Lee, Jong-Seok
  • Kang, Ey-Goo
  • Sung, Man Young
Citations

WEB OF SCIENCE

12
Citations

SCOPUS

17

초록

In this paper we introduced the shielding region concept in order to relieve the electric field concentrated on the trench bottom corner. The shielded trench gate insulated gate bipolar transistor (IGBT) is a trench gate IGBT with a P+ shielding region located in the bottom of a trench gate. By simulation results, we verified that a shielding region reduced the electric fields not only in the gate oxide but also in the P-base region. Compared with conventional trench gate IGBT, about 33% increment of forward breakdown voltages are achieved, but little forward voltage drop, which causes on-state loss to be increased by about 0.06 V in the shielded trench gate IGBT. (c) 2007 Elsevier Ltd. All rights reserved.

키워드

trenchIGBTbreakdown voltageon-state voltage dropshielding regionELECTRODE IGBT
제목
Shielding region effects on a trench gate IGBT
저자
Lee, Jong-SeokKang, Ey-GooSung, Man Young
DOI
10.1016/j.mejo.2007.10.023
발행일
2008-01
유형
Article
저널명
Microelectronics Journal
39
1
페이지
57 ~ 62