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Comparison of Fenton and US/Fenton for degradation of DEP and effect of power density on degradation
- 제목
- Comparison of Fenton and US/Fenton for degradation of DEP and effect of power density on degradation
- 저자
- Khim, Jeehyeong
- 학회명
- The 31th Symposium on ULTRASONIC ELECTRONICS
- 학회 개최일
- 2010-12-06 ~ 2010-12-08