Conducting surface layers formed by hydrogenation of O-implanted beta-Ga2O3

  • Polyakov, A. Y.
  • Vasilev, A. A.
  • Shchemerov, I. V.
  • Chernykh, A. V.
  • Shetinin, I. V.
  • ... Lee, In-Hwan
  • 외 8명
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초록

Lightly n-type beta-Ga2O3 grown by Halide Vapor Phase Epitaxy (HVPE) on heavily n-type doped beta-Ga2O3 substrate was implanted with 1 MeV O ions to a fluence of 1016 cm-2. The film remained beta-polymorph and showed no broadening of the x-ray rocking curve width after irradiation even though the calculated number of primary defects was very high. The implanted region was characterized by a strong compensation, likely due to the presence of a high density of split Ga vacancy acceptors. Treatment of the irradiated film in dense hydrogen plasma at 330 degrees C for 0.5 h led to the formation of a conducting surface layer about 0.5 pm-thick with carrier density 1017 cm-3, a suppression of the signal due to Fe acceptors in Deep Level transient Spectroscopy (DLTS) and a strong enhancement of DLTS peak caused by centers at Ec-0.74 eV (so called E2 * traps). The mechanism appears to be that hydrogen plasma treatment leads to creation of a high number of donor states due complexing of hydrogen with Ga vacancies and to passivation of Fe acceptors with hydrogen donors.

키워드

Gallium OxidePolymorphsImplantationHydrogenationVacancies
제목
Conducting surface layers formed by hydrogenation of O-implanted beta-Ga2O3
저자
Polyakov, A. Y.Vasilev, A. A.Shchemerov, I. V.Chernykh, A. V.Shetinin, I. V.Zhevnerov, E. V.Kochkova, A. I.Lagov, P. B.Miakonkikh, A. V.Pavlov, Yu. S.Kobets, U. A.Lee, In-HwanKuznetsov, A.Pearton, S. J.
DOI
10.1016/j.jallcom.2023.169258
발행일
2023-06-05
유형
Article
저널명
Journal of Alloys and Compounds
945