Physics-Based Compact Model of Parasitic Bipolar Transistor for Single-Event Transients in FinFETs

  • Yi, Boram; 
  • Lee, Boung Jun; 
  • Oh, Jin-Hwan; 
  • Kim, Ji-Seon; 
  • Kim, Jun-Hyeok; 
  • ... Yang, Ji-Woon
Citations

WEB OF SCIENCE

6
Citations

SCOPUS

10

초록

A physics-based compact model of the parasitic bipolar current induced by an energetic particle is presented for single-event transients in FinFETs. The terminal charges are modeled to predict the body voltage of the FinFET in the transient correctly. The models are implemented using Verilog-A and are verified through 3-D technology computer-aided design (TCAD) simulations. The results of the modeling show good agreement with the TCAD data, for both structural variations and energy variations of the energetic particles.

키워드

Compact model; FinFET; parasitic bipolar junction transistor (BJT) current; single-event transient (SET); SIMULATION; MOSFETS; DEVICES; PLANAR; LOGIC
제목
Physics-Based Compact Model of Parasitic Bipolar Transistor for Single-Event Transients in FinFETs
저자
Yi, Boram; Lee, Boung Jun; Oh, Jin-Hwan; Kim, Ji-Seon; Kim, Jun-Hyeok; Yang, Ji-Woon
DOI
10.1109/TNS.2018.2796622
발행일
2018-03
유형
Article
저널명
IEEE Transactions on Nuclear Science
권
65
호
3
페이지
866 ~ 870