Via-Hole-Type Flip-Chip Packaging to Improve the Thermal Characteristics and Reliability of Blue Light Emitting Diodes

  • Kim, Ho Young
  • Lim, Chang Man
  • Kim, Ki Seok
  • Oh, Jeong Tak
  • Jeong, Hwan-Hee
  • 외 3명
Citations

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Citations

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초록

We investigated the effect of via-holes in the lead-frame on the reliability of blue flip-chip light-emitting diodes (FCLEDs). For bonding, conventional Sn-Ag(3.0%)-Cu(0.5%) solder (SAC) and Ag sintered paste were adopted. Lateral LED, conventional FCLED (c-FCLED), and via-hole FCLED gave efficacies of 218.5, 221.6 and 225 1m/W at 30 mA. The lateral LED sample (bonding material: silicone), c-FCLED sample (SAC), via-hole-type sample (Ag sinter), and via-hole-type sample (SAC) exhibited total thermal resistance of 15.24, 10.19, 8.95, and 11.79 K/W, respectively. The humidity/temperature/H2S gas reliability examinations showed that unlike the via-hole-type samples, the lumen of the c-FCLED was fallen by 15.0% after exposure for 500 h. Furthermore, the c-FCLED exhibited a 19.6% higher forward voltage than the via-hole FCLED after 1,000 thermal-cycles. SEM results showed that unlike the via-hole type FCLED, the c-FCLED underwent cracking after thermal cycle of 1000 times. (C) 2019 The Electrochemical Society.

키워드

HIGHLY REFLECTIVE ITO/DBRP-TYPELEDSENHANCEMENTRESISTANCECONTACTSSILICONOUTPUTCU
제목
Via-Hole-Type Flip-Chip Packaging to Improve the Thermal Characteristics and Reliability of Blue Light Emitting Diodes
저자
Kim, Ho YoungLim, Chang ManKim, Ki SeokOh, Jeong TakJeong, Hwan-HeeSong, June-OSeong, Tae-YeonAmano, Hiroshi
DOI
10.1149/2.0171909jss
발행일
2019-08-22
유형
Article
저널명
ECS Journal of Solid State Science and Technology
8
9
페이지
Q165 ~ Q170