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Yield Prediction using Support Vectors based Under-Sampling in Semiconductor Process
- 제목
- Yield Prediction using Support Vectors based Under-Sampling in Semiconductor Process
- 저자
- Jun-Geol Baek
- 발행일
- 2012-12-24
- 학회명
- International Conference on Industrial and Mechanical Engineering 2012
- 개최국가
- 태국
- 학회 개최일
- 2012-12-24 ~ 2012-12-25