50 GHz Four-Port Coupling-Reduced Probe Card Utilizing Pogo Pins Housed in Custom Metallic Socket

  • Lee, K. M.; 
  • Kim, J. S.; 
  • Ahn, S.; 
  • Park, E.; 
  • Myeong, J.; 
  • ... Kim, M.
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초록

A design for a pogo-pin probe card featuring a metallic socket is proposed to eliminate signal leakage and coupling loss in a multi-port environment. The proposed metallic pogo-pin socket includes a metal wall structure between adjacent pogo pins, ensuring complete isolation. This metal wall offers an advantage in removing coupling issues between pogo pins that can occur with typical dielectric pogo-pin sockets. The designed probe card is fabricated as a prototype and verified for its performance. Measurement results using a test through line show that coupled power is minimized, providing a low-loss transmission performance of -2.14 dB to an RF chip at 50 GHz, all within a compact size. Although the dielectric spacer used to secure the pogo pins allows for some leakage, it can maintain a low coupling performance of under -15 dB in the millimeter-wave band. The prototype probe card can deliver an RF signal to a 5G circuit with a low loss of -0.7 dB at 28 GHz and -1.9 dB at 39 GHz frequency. The designed probe card is capable of transmitting multiple RF signals to the RF system without signal distortion in a multi-port environment.

키워드

RF probe cards; mm-wave multi-port testing; metallic socket; coupling removal technique
제목
50 GHz Four-Port Coupling-Reduced Probe Card Utilizing Pogo Pins Housed in Custom Metallic Socket
저자
Lee, K. M.; Kim, J. S.; Ahn, S.; Park, E.; Myeong, J.; Kim, M.
DOI
10.3390/s24123745
발행일
2024-06
유형
Article
저널명
Sensors
권
24
호
12