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Atomic force microscopy study of GaN-buffer layers on SiC(0001) by MOCVD

제목
Atomic force microscopy study of GaN-buffer layers on SiC(0001) by MOCVD
저자
BYUN, Dong Jin
학회명
Materials Research Society
학회 개최일
2002-01-01 ~ 2002-01-02

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