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On the Scaling Limits of Low-Frequency Noise in SiGe HBTs

제목
On the Scaling Limits of Low-Frequency Noise in SiGe HBTs
저자
Rieh, Jae-Sung
학회명
International Semiconductor Device Research Symposium
학회 개최일
2003-12-10 ~ 2003-12-12

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