An Improved Understanding of the Relationship between Interface Roughness of ZnS:Pr, Ce Phosphor - Ta2O5 Insulating Film and Electrical Characteristics of TFEL Devices
Sung, Man Young
제목
An Improved Understanding of the Relationship between Interface Roughness of ZnS:Pr, Ce Phosphor - Ta2O5 Insulating Film and Electrical Characteristics of TFEL Devices