The X-ray sensitivity of semi-insulating polycrystalline CdZnTe thick films

초록

The X-ray sensitivity is one of the important parameters indicating the detector performance. The X-ray sensitivity of semi-insulating polycrystalline CdZnTe:Cl thick films was investigated as a function of electric field, mean photon energy, film thickness, and charge carrier transport parameters and, compared with another promising detector materials. The X-ray sensitivities of the polycrystalline CdZnTe films with 350 mu m thickness were about 2.2 and 6.2 mu C/cm(2)/R in the ohmic-type and Schottky-type detector at 0.83 V/mu m, respectively. (C) 2008 Elsevier B.V. All rights reserved.

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