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Low Temperature Characterization of PMOS-type Gate-all-around Silicon nanowire FETs as single-hole-transistors

  • Hwang, Sung Woo
제목
Low Temperature Characterization of PMOS-type Gate-all-around Silicon nanowire FETs as single-hole-transistors
저자
Hwang, Sung Woo
학회명
30th International Conference on the Physics of Semiconductors (ICPS2010)
개최국가
대한민국
학회 개최일
2010-07-25 ~ 2010-07-30

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