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Temperature Dependence of Mobility Degradation and Total Series Resistance in Gate-all-around PMOS Silicon NanowireFETs

  • Hwang, Sung Woo
제목
Temperature Dependence of Mobility Degradation and Total Series Resistance in Gate-all-around PMOS Silicon NanowireFETs
저자
Hwang, Sung Woo
학회명
2009 Silicon Nanoelectronics Workshop
개최국가
일본
학회 개최일
2009-06-13 ~ 2009-06-14

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