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V1SCAN: Discovering 1-day Vulnerabilities in Reused C/C++ Open-source Software Components Using Code Classification Techniques
V1SCAN: Discovering 1-day Vulnerabilities in Reused C/C++ Open-source Software Components Using Code Classification Techniques
- 제목
- V1SCAN: Discovering 1-day Vulnerabilities in Reused C/C++ Open-source Software Components Using Code Classification Techniques
- 제목 (타언어)
- V1SCAN: Discovering 1-day Vulnerabilities in Reused C/C++ Open-source Software Components Using Code Classification Techniques
- 저자
- Heejo Lee
- 발행일
- 2023-08-09
- 학회명
- USENIX Security '23
- 개최국가
- 미국
- 학회 개최일
- 2023-08-09 ~ 2023-08-11