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- 제목
- Evaluation of Electrical Properties and Residual Stress for PZT (52/48) Films by Sol-gel Routes with Raman Spectroscopy
- 저자
- PARK, JUNG HO
- 학회명
- Integrated Ferroelectrics, The 15th International Symposium on Intergrated Ferroelectrics
- 학회 개최일
- 2003-03-09 ~ 2003-03-12