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Atomic Force Microscopy Study of GaN-Buffer Layers on SiC(0001) by MOCVD

  • CHOI, In-Hoon
제목
Atomic Force Microscopy Study of GaN-Buffer Layers on SiC(0001) by MOCVD
저자
CHOI, In-Hoon
학회명
Proceedings of 1996 MRS Spring Meeting
학회 개최일
1996-01-01

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