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An improved understanding of the relationship between interface roughness of ZnS:Pr, Ce phosphor-Ta2O5 insulating film and electrical characteristics of TFEL devices
- 제목
- An improved understanding of the relationship between interface roughness of ZnS:Pr, Ce phosphor-Ta2O5 insulating film and electrical characteristics of TFEL devices
- 저자
- Ju, Byeongkwon
- 학회명
- Proc. SID’98
- 학회 개최일
- 1998-05-17 ~ 1998-05-22