Point Cloud Based Representations Learning for Wafer Pattern Recognition in Semiconductor Fabrication Process

Point Cloud Based Representations Learning for Wafer Pattern Recognition in Semiconductor Fabrication Process
제목
Point Cloud Based Representations Learning for Wafer Pattern Recognition in Semiconductor Fabrication Process
제목 (타언어)
Point Cloud Based Representations Learning for Wafer Pattern Recognition in Semiconductor Fabrication Process
저자
Jun-Geol Baek
발행일
2022-07-20
학회명
International Conference on Precision Engineering and Sustainable Manufacturing 2022 (PRESM 2022)
개최지
Jeju, Korea
개최국가
대한민국
학회 개최일
2022-07-20 ~ 2022-07-22