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Process variability analysis of a Si/SiGe HBT technology with greater than 200 GHz performance
- 제목
- Process variability analysis of a Si/SiGe HBT technology with greater than 200 GHz performance
- 저자
- Rieh, Jae-Sung
- 학회명
- 2002 Bipolar/BiCMOS Circuits and Technology Meeting
- 학회 개최일
- 2002-09-29 ~ 2002-10-01