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Mechanism of Low Frequency Noise and Trap Density Profile in Dual Gate Metal Oxide Thin Film Transistor
Mechanism of Low Frequency Noise and Trap Density Profile in Dual Gate Metal Oxide Thin Film Transistor
- 제목
- Mechanism of Low Frequency Noise and Trap Density Profile in Dual Gate Metal Oxide Thin Film Transistor
- 제목 (타언어)
- Mechanism of Low Frequency Noise and Trap Density Profile in Dual Gate Metal Oxide Thin Film Transistor
- 저자
- LEE Jae Woo
- 발행일
- 2021-08-25
- 학회명
- 22nd International Meeting on Information Display (IMID 2022)
- 개최국가
- 대한민국
- 학회 개최일
- 2021-08-25 ~ 2021-08-27