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Enhancement of depth selectivity in reflection phase microscopy by successive accumulation of interferograms
Enhancement of depth selectivity in reflection phase microscopy by successive accumulation of interferograms
- 제목
- Enhancement of depth selectivity in reflection phase microscopy by successive accumulation of interferograms
- 제목 (타언어)
- Enhancement of depth selectivity in reflection phase microscopy by successive accumulation of interferograms
- 저자
- Kim, Beop-Min
- 발행일
- 2020-02-03
- 학회명
- PHOTONICS WEST 2020
- 개최국가
- 미국
- 학회 개최일
- 2020-02-01 ~ 2020-02-06