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Extraction of Intrinsic Electrical Parameters in Partially Depleted MoS2 Field-Effect Transistors
- Jeon, Dae-Young;
- Lee, Dong Su;
- Lee, Seoung-Ki;
- Park, Min;
- Park, So Jeong;
- ... Kim, Gyu-Tae
WEB OF SCIENCE
11SCOPUS
10초록
Electrical performance and transport mechanisms in 2-D transition-metal dichalcogenide materials should be investigated under a range of electrical parameters for practical application. In this paper, partially depleted (PD) molybdenum disulfide (MoS2) transistors were fabricated with a thick flake mechanically exfoliated from bulk crystals, and their operating mechanism is discussed considering the gate-uncontrollable conduction channel, the maximum depletion width (D-max), and the impact of series resistance (R-sd). In addition, the intrinsic mobility of a neutral bulk channel in PD-MoS2 transistors was extracted from the simply separated gate-controllable drain current with a depletion approximation.
키워드
- 제목
- Extraction of Intrinsic Electrical Parameters in Partially Depleted MoS2 Field-Effect Transistors
- 저자
- Jeon, Dae-Young; Lee, Dong Su; Lee, Seoung-Ki; Park, Min; Park, So Jeong; Kim, Gyu-Tae
- 발행일
- 2018-07
- 유형
- Article
- 권
- 65
- 호
- 7
- 페이지
- 3050 ~ 3053
- 언어
- ENG
- 출판사
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- 발행국가
- 미국
- 분량
- 4 페이지
- ISSN
- E 1557-9646
P 0018-9383