Extraction of Intrinsic Electrical Parameters in Partially Depleted MoS2 Field-Effect Transistors

  • Jeon, Dae-Young; 
  • Lee, Dong Su; 
  • Lee, Seoung-Ki; 
  • Park, Min; 
  • Park, So Jeong; 
  • ... Kim, Gyu-Tae
Citations

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SCOPUS

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초록

Electrical performance and transport mechanisms in 2-D transition-metal dichalcogenide materials should be investigated under a range of electrical parameters for practical application. In this paper, partially depleted (PD) molybdenum disulfide (MoS2) transistors were fabricated with a thick flake mechanically exfoliated from bulk crystals, and their operating mechanism is discussed considering the gate-uncontrollable conduction channel, the maximum depletion width (D-max), and the impact of series resistance (R-sd). In addition, the intrinsic mobility of a neutral bulk channel in PD-MoS2 transistors was extracted from the simply separated gate-controllable drain current with a depletion approximation.

키워드

2-D transition-metal dichalcogenides (TMDs); bulk channel mobility; maximum depletion width; partially depleted (PD); series resistance
제목
Extraction of Intrinsic Electrical Parameters in Partially Depleted MoS2 Field-Effect Transistors
저자
Jeon, Dae-Young; Lee, Dong Su; Lee, Seoung-Ki; Park, Min; Park, So Jeong; Kim, Gyu-Tae
DOI
10.1109/TED.2018.2836345
발행일
2018-07
유형
Article
저널명
IEEE Transactions on Electron Devices
권
65
호
7
페이지
3050 ~ 3053