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The Impact of Series Resistance in Multi Omega -gate Silicon Nanowires PMOS FETs by Low Frequency Noise Analysis
The Impact of Series Resistance in Multi Omega -gate Silicon Nanowires PMOS FETs by Low
Frequency Noise Analysis
- 제목
- The Impact of Series Resistance in Multi Omega -gate Silicon Nanowires PMOS FETs by Low Frequency Noise Analysis
- 제목 (타언어)
- The Impact of Series Resistance in Multi Omega -gate Silicon Nanowires PMOS FETs by Low Frequency Noise Analysis
- 저자
- LEE Jae Woo
- 발행일
- 2018-07-03
- 학회명
- AWAD 2018 : Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices
- 개최지
- 기타큐슈
- 개최국가
- 일본
- 학회 개최일
- 2018-07-02 ~ 2018-07-04