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6W/25mm2 Inductive Power Transfer for Non-Contact Wafer-Level Testing
6W/25mm2 Inductive Power Transfer for Non-Contact Wafer-Level Testing
- 제목
- 6W/25mm2 Inductive Power Transfer for Non-Contact Wafer-Level Testing
- 제목 (타언어)
- 6W/25mm2 Inductive Power Transfer for Non-Contact Wafer-Level Testing
- 저자
- Hayun Cecillia Chung
- 발행일
- 2011-02-22
- 학회명
- IEEE International Solid-State Circuits Conference 2011
- 개최국가
- 미국
- 학회 개최일
- 2011-02-20 ~ 2011-02-24