상세 보기
Electrical characteristic study of nano-scale Ge2Sb2Te5 using nano imprint lithography and conductive atomic force microscopy
- 제목
- Electrical characteristic study of nano-scale Ge2Sb2Te5 using nano imprint lithography and conductive atomic force microscopy
- 저자
- Lee, Heon
- 학회명
- 216th ECS
- 개최국가
- 오스트리아
- 학회 개최일
- 2009-10-04 ~ 2009-10-09