Observation and modeling of the thermal runaway of high-capacity pouch cells due to an internal short induced by an indenter

  • Park, Sang-Youn; 
  • Mallarapu, Anudeep; 
  • Lim, Jaeyoung; 
  • Santhanagopalan, Shriram; 
  • Han, Yongha; 
  • ... Choi, Byoung-Ho
Citations

WEB OF SCIENCE

17
Citations

SCOPUS

19

초록

Owing to the complexity of coupling mechanical and electrical solvers for finite element analysis (FEA) of mechanical abuse of a battery, the simulation should be performed by incorporating a local short circuit model activated based on the status of battery elements. However, the approach should also consider various other conditions of the battery simulated, such as the initial state of charge (SOC), for precise simulations of the internal short. This study proposes an approach developed with a mechanical model and single-particle battery model, along with a reaction kinetics model for thermal abuse using LS-DYNA. Several key parameters were selected, such as the activation criteria, kinetic abuse and element integration points during the internal short circuit induced by the indenter. The impact of these key parameters in the FEA on thermal runaway response for various initial SOCs from 25to 100 % were analyzed. The FEA results obtained were compared against experimental results with various parameters such as activation criterion of internal short, kinetic abuse based on accelerating rate calorimetry (ARC) data. Finally, the root causes of the discrepancy between the FEA and experimental results are discussed regarding integration point what solver can make difference during calculation.

키워드

Thermal runaway; High -capacity pouch battery; Internal short; Finite element analysis; State of charge; Kinetic abuse; LITHIUM-ION BATTERIES; MULTIPHYSICS COMPUTATIONAL FRAMEWORK; FINITE-ELEMENT SIMULATION; SHORT-CIRCUIT DETECTION; SINGLE-PARTICLE MODEL; LITHIUM/POLYMER BATTERY; MECHANICAL-PROPERTIES; TEMPERATURE; BEHAVIOR; FEATURES
제목
Observation and modeling of the thermal runaway of high-capacity pouch cells due to an internal short induced by an indenter
저자
Park, Sang-Youn; Mallarapu, Anudeep; Lim, Jaeyoung; Santhanagopalan, Shriram; Han, Yongha; Choi, Byoung-Ho
DOI
10.1016/j.est.2023.108518
발행일
2023-11-25
유형
Article
저널명
Journal of Energy Storage
권
72