Low-temperature operation of junctionless nanowire transistors: Less surface roughness scattering effects and dominant scattering mechanisms

  • Jeon, Dae-Young; 
  • Park, So Jeong; 
  • Mouis, Mireille; 
  • Barraud, Sylvain; 
  • Kim, Gyu-Tae; 
  • 외 1명
Citations

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SCOPUS

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초록

The less surface roughness scattering effects, owing to the unique operation principle, in junctionless nanowire transistors (JLT-NW) were shown by low-temperature characterization and 2D numerical simulation results. This feature could allow a better current drive under a high gate bias. In addition, the dominant scattering mechanisms in JLT-NW, with both a short (L-M = 30 nm) and a long channel (L-M = 10 mu m), were investigated through an in-depth study of the temperature dependence of transconductance (g(m)) behavior and compared to conventional inversion-mode nanowire transistors. (C) 2014 AIP Publishing LLC.

키워드

ELECTRICAL CHARACTERIZATION; CHANNEL WIDTH; MOSFETS
제목
Low-temperature operation of junctionless nanowire transistors: Less surface roughness scattering effects and dominant scattering mechanisms
저자
Jeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard
DOI
10.1063/1.4905366
발행일
2014-12-29
유형
Article
저널명
Applied Physics Letters
권
105
호
26