상세 보기
Low-temperature operation of junctionless nanowire transistors: Less surface roughness scattering effects and dominant scattering mechanisms
- Jeon, Dae-Young;
- Park, So Jeong;
- Mouis, Mireille;
- Barraud, Sylvain;
- Kim, Gyu-Tae;
- 외 1명
Citations
WEB OF SCIENCE
19Citations
SCOPUS
19초록
The less surface roughness scattering effects, owing to the unique operation principle, in junctionless nanowire transistors (JLT-NW) were shown by low-temperature characterization and 2D numerical simulation results. This feature could allow a better current drive under a high gate bias. In addition, the dominant scattering mechanisms in JLT-NW, with both a short (L-M = 30 nm) and a long channel (L-M = 10 mu m), were investigated through an in-depth study of the temperature dependence of transconductance (g(m)) behavior and compared to conventional inversion-mode nanowire transistors. (C) 2014 AIP Publishing LLC.
키워드
ELECTRICAL CHARACTERIZATION; CHANNEL WIDTH; MOSFETS
- 제목
- Low-temperature operation of junctionless nanowire transistors: Less surface roughness scattering effects and dominant scattering mechanisms
- 저자
- Jeon, Dae-Young; Park, So Jeong; Mouis, Mireille; Barraud, Sylvain; Kim, Gyu-Tae; Ghibaudo, Gerard
- 발행일
- 2014-12-29
- 유형
- Article
- 권
- 105
- 호
- 26
- 언어
- ENG
- 출판사
- AMER INST PHYSICS
- 발행국가
- 미국
- ISSN
- E 1077-3118
P 0003-6951