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Long-term reliability of Si/Si0.7Ge0.3/Si HBTs from accelerated lifetime testing
- 제목
- Long-term reliability of Si/Si0.7Ge0.3/Si HBTs from accelerated lifetime testing
- 저자
- Rieh, Jae-Sung
- 학회명
- Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems
- 학회 개최일
- 2001-09-12 ~ 2001-09-14