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A 100mK-NETD 100ms-startup-time 80×60 micro-bolometer CMOS thermal imager integrated with a 0.234mm2 1.89μVrms noise 12b biasing DAC
A 100mK-NETD 100ms-startup-time 80×60 micro-bolometer CMOS thermal imager integrated with a 0.234mm2 1.89μVrms noise 12b biasing DAC
- 제목
- A 100mK-NETD 100ms-startup-time 80×60 micro-bolometer CMOS thermal imager integrated with a 0.234mm2 1.89μVrms noise 12b biasing DAC
- 제목 (타언어)
- A 100mK-NETD 100ms-startup-time 80×60 micro-bolometer CMOS thermal imager integrated with a 0.234mm2 1.89μVrms noise 12b biasing DAC
- 저자
- Lee, Hyung-Min
- 발행일
- 2018-02-13
- 학회명
- IEEE Int. Solid-State Circuits Conf. (ISSCC)
- 개최지
- San Francisco, CA, USA
- 개최국가
- 미국
- 학회 개최일
- 2018-02-11 ~ 2018-02-15