Investigation of damage caused by partial shading of CuInxGa((1-x))Se(2) photovoltaic modules with bypass diodes

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초록

This study evaluated the impact of partial shading on CuInxGa((1-x))Se(2) (CIGS) photovoltaic (PV) modules equipped with bypass diodes. When the CIGS PV modules were partially shaded, they were subjected to partial reverse bias, leading to the formation of hotspots and a possible occurrence of junction damage. In a module with a cadmium sulfide buffer layer, hotspots and wormlike defects were formed. The hotspots were formed as soon as the modules were shaded; the hotspots caused permanent damage (wormlike defects) in the CIGS module. Specifically, the wormlike defects were caused by the window layer, leading to increased recombination and decay of the solar cell properties. However, a CIGS module with a zinc sulfide buffer layer did not exhibit the formation of hotspots or any visual damage. The reverse bias breakdown voltage of the CIGS PV module with the cadmium sulfide buffer layer was higher than that of the CIGS PV module with the zinc sulfide buffer layer. Copyright (c) 2016 John Wiley & Sons, Ltd.

키워드

Cu(In; Ga)Se-2 module; partial shading; bypass diode; reliability; hotspot; wormlike defect
제목
Investigation of damage caused by partial shading of CuInxGa((1-x))Se(2) photovoltaic modules with bypass diodes
저자
Lee, Ji Eun; Bae, Soohyun; Oh, Wonwook; Park, Hyomin; Kim, Soo Min; Lee, Dongho; Nam, Junggyu; Mo, Chan Bin; Kim, Dongseop; Yang, JungYup; Kang, Yoonmook; Lee, Hae-seok; Kim, Donghwan
DOI
10.1002/pip.2738
발행일
2016-08
유형
Article
저널명
Progress in Photovoltaics: Research and Applications
권
24
호
8
페이지
1035 ~ 1043