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A Spatial Point Pattern Analysis to Recognize Fail Bit Patterns in Semiconductor Manufacturing
- 제목
- A Spatial Point Pattern Analysis to Recognize Fail Bit Patterns in Semiconductor Manufacturing
- 저자
- Jun-Geol Baek
- 발행일
- 2014-02-17
- 학회명
- International Conference on Manufacturing Systems Engineering and Management (ICMSEM 2014)
- 개최지
- Istanbul, Turkey
- 개최국가
- 튀르키예
- 학회 개최일
- 2014-02-17 ~ 2014-02-18