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Unipolar resistive switching phenomena in fully transparent SiN-based memory cells
- Kim, Hee-Dong;
- An, Ho-Myoung;
- Hong, Seok Man;
- Kim, Tae Geun
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41초록
We report the first fabrication of a transparent resistive switching memory (T-RSM) device using ITO/SiN/ITO capacitors that show a stable endurance of > 100 cycles and a retention time of > 10(5) s at 85 degrees C under unipolar switching operation. This device shows optical transmittance approximately 70% in the visible region. Both temperature-dependent studies and power-law relations at ON/OFF states reveal that metallic conduction is mainly responsible for the ON state, whereas the insulating property and a weak filament are observed for the OFF state at once. We believe that this SiN-based T-RSM could be a milestone for future see-through electronic devices.
- 제목
- Unipolar resistive switching phenomena in fully transparent SiN-based memory cells
- 저자
- Kim, Hee-Dong; An, Ho-Myoung; Hong, Seok Man; Kim, Tae Geun
- 발행일
- 2012-12
- 유형
- Article
- 권
- 27
- 호
- 12