Unipolar resistive switching phenomena in fully transparent SiN-based memory cells

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초록

We report the first fabrication of a transparent resistive switching memory (T-RSM) device using ITO/SiN/ITO capacitors that show a stable endurance of > 100 cycles and a retention time of > 10(5) s at 85 degrees C under unipolar switching operation. This device shows optical transmittance approximately 70% in the visible region. Both temperature-dependent studies and power-law relations at ON/OFF states reveal that metallic conduction is mainly responsible for the ON state, whereas the insulating property and a weak filament are observed for the OFF state at once. We believe that this SiN-based T-RSM could be a milestone for future see-through electronic devices.

제목
Unipolar resistive switching phenomena in fully transparent SiN-based memory cells
저자
Kim, Hee-DongAn, Ho-MyoungHong, Seok ManKim, Tae Geun
DOI
10.1088/0268-1242/27/12/125020
발행일
2012-12
유형
Article
저널명
Semiconductor Science and Technology
27
12