Impurity scattering effects on transport through gate-all-around Si nanowires

  • Oh, Jung Hyun
  • Ahn, D.
  • Hwang, S. W.
  • Hwang, J. S.
  • Son, M. H.
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초록

We investigate effects of impurity scattering on current-voltage characteristics in a gate-all-around Si nanowire theoretically. Using non-equilibrium. Green's function technique, the self-energy for the impurity scattering is incorporated under the self-consistent Born approximation. We show that the impurity scattering changes the electronic structure of the Si nanowire largely and, thus, results in very different current-voltage curves compared to the case of the free-impurity scattering. (C) 2007 Published by Elsevier B.V.

키워드

nanowire transistorGreen's functionimpurity scattering
제목
Impurity scattering effects on transport through gate-all-around Si nanowires
저자
Oh, Jung HyunAhn, D.Hwang, S. W.Hwang, J. S.Son, M. H.
DOI
10.1016/j.physe.2007.09.080
발행일
2008-03
유형
Article; Proceedings Paper
저널명
Physica E: Low-Dimensional Systems and Nanostructures
40
5
페이지
1526 ~ 1529