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Quantitative Assessment of Patch Test Results using Stereoimage Optical Profilometer

  • KIM, Il-Hwan
제목
Quantitative Assessment of Patch Test Results using Stereoimage Optical Profilometer
저자
KIM, Il-Hwan
학회명
12th Int symposium on Bieoengineering and skin
개최지
보스턴
개최국가
미국
학회 개최일
1998-01-01 ~ 1998-01-01

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