ScholarWorks@고려대학교

상세 보기

Degradation characteristics in 200 GHz fT / 285 GHz fMAX SiGe HBTs

제목
Degradation characteristics in 200 GHz fT / 285 GHz fMAX SiGe HBTs
저자
Rieh, Jae-Sung
학회명
IEEE GaAs IC Symposium
학회 개최일
2003-11-09 ~ 2003-11-12

ScholarWorks@고려대학교

02841 서울특별시 성북구 안암로 145 Tel. 02-3290-2963

COPYRIGHT © 고려대학교 All Rights Reserved.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.

You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.